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Proceedings Paper

Design aspects of compact microextensometer integrated with microscope
Author(s): Leszek A Salbut
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Proc. SPIE 5145, Microsystems Engineering: Metrology and Inspection III, ; doi: 10.1117/12.500844
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Leszek A Salbut, Warsaw Univ. of Technology (Poland)


Published in SPIE Proceedings Vol. 5145:
Microsystems Engineering: Metrology and Inspection III
Christophe Gorecki, Editor(s)

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