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Proceedings Paper

System for off-line optical paper inspection and quality control
Author(s): Hugo A. Navarrete; Cristina Cadevall; Mouade Bouydain; Joan Anto; Josep M. Pladellorens; Josep F. Colom; Agusti Tosas
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Paper Abstract

A device has been designed for off-line optical paper inspection and quality control of stripes and holes in the cigarette paper. Hardware description is first presented including main paper characteristics to be measured. Typical paper stripe and holes structures are then discussed with image processing and analysis considerations to discriminate these structures, focusing in the problems derived from the small area of holes and of their internal structure that is analyzed with a confocal microscope. Algorithms for image processing and analysis are described. These algorithms involve equalization, binarization, stripes structure detection, holes distribution and statistics.

Paper Details

Date Published: 30 May 2003
PDF: 9 pages
Proc. SPIE 5144, Optical Measurement Systems for Industrial Inspection III, (30 May 2003); doi: 10.1117/12.500672
Show Author Affiliations
Hugo A. Navarrete, Univ. Politecnica de Catalunya (Spain)
Cristina Cadevall, Univ. Politecnica de Catalunya (Spain)
Mouade Bouydain, Univ. Politecnica de Catalunya (Spain)
Joan Anto, Univ. Politecnica de Catalunya (Spain)
Josep M. Pladellorens, Univ. Politecnica de Catalunya (Spain)
Josep F. Colom, Univ. Politecnica de Catalunya (Spain)
Agusti Tosas, Miquel y Costas & Miquel, S. A. (Spain)


Published in SPIE Proceedings Vol. 5144:
Optical Measurement Systems for Industrial Inspection III
Wolfgang Osten; Malgorzata Kujawinska; Katherine Creath, Editor(s)

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