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Proceedings Paper

Rigorous characterization of time-resolved diffuse spectroscopy systems for measurements of absorption and scattering properties using solid phantoms
Author(s): Johannes Swartling; Antonio Pifferi; Eleonora Giambattistelli; Ekaterine Chikoidze; Alessandro Torricelli; Paola Taroni; Magnus Andersson; Anders Nilsson; Stefan Andersson-Engels
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Paper Abstract

Two systems for measurements of absorption and scattering properties, based on picosecond-pulse lasers and singlephoton counting detection, were characterized using a detailed protocol. The first system utilizes diode lasers at 660, 785, 910 and 974 nm as light sources. The second employs a Ti:sapphire and a mode-locked dye laser to produce tunable pulses in the range 610 - 1000 nm. Using solid tissue phantoms, the systems were rigorously characterized and compared in terms of absolute accuracy of the measured scattering and absorption coefficients, the linearity over the parameter range, the precision with respect to injected light energy, the stability over time, and the reproducibility of the results. The phantoms were made of epoxy resin with TiO as scatterer and black toner powder as absorber.

Paper Details

Date Published: 15 October 2003
PDF: 8 pages
Proc. SPIE 5138, Photon Migration and Diffuse-Light Imaging, (15 October 2003); doi: 10.1117/12.500580
Show Author Affiliations
Johannes Swartling, Lund Institute of Technology (Sweden)
Antonio Pifferi, Politecnico di Milano, INFM (Italy)
IFN-CNR (Italy)
Eleonora Giambattistelli, Politecnico di Milano, INFM (Italy)
IFN-CNR (Italy)
Ekaterine Chikoidze, Politecnico di Milano, INFM (Italy)
IFN-CNR (Italy)
Alessandro Torricelli, Politecnico di Milano, INFM (Italy)
IFN-CNR (Italy)
Paola Taroni, Politecnico di Milano, INFM (Italy)
IFN-CNR (Italy)
Magnus Andersson, Lund Institute of Technology (Sweden)
Anders Nilsson, Lund Institute of Technology (Sweden)
Stefan Andersson-Engels, Lund Institute of Technology (Sweden)

Published in SPIE Proceedings Vol. 5138:
Photon Migration and Diffuse-Light Imaging
David A. Boas, Editor(s)

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