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Proceedings Paper

Sampling function in en-face OCT
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Paper Abstract

En-face OCT relies on scanning fast along a direction perpendicular to the optical axis. C-scan images (en-face slices at constant depth) can be obtained at different depths. The quality of the image and what part of a particular layer is visible depends on the properties of the sampling function. In this paper we examine how the scanning configuration, the interface optics, the coherence length of the source used, and the object itself influence the shape of the sampling function.

Paper Details

Date Published: 2 October 2003
PDF: 9 pages
Proc. SPIE 5140, Optical Coherence Tomography and Coherence Techniques, (2 October 2003); doi: 10.1117/12.500311
Show Author Affiliations
Iwona Gorczynska, Nicolaus Copernicus Univ. (Poland)
Adrian Gh. Podoleanu, Univ. of Kent at Canterbury (United Kingdom)
Radu G. Cucu, Univ. of Kent at Canterbury (United Kingdom)
David A. Jackson, Univ. of Kent at Canterbury (United Kingdom)


Published in SPIE Proceedings Vol. 5140:
Optical Coherence Tomography and Coherence Techniques
Wolfgang Drexler, Editor(s)

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