Share Email Print

Proceedings Paper

Multifrequency laser beam use in an interferometer vibration measuring system
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

It was discussed the using multi-frequency YAG:Nd infrared laser for long range non-destructive acoustic vibration measuring system for structural modal analysis. It was shown both theoretically and experimentally that a coherent function of a laser with acousto-optic device has an oscillations with the period depending on a laser cavity length and a number of resonator modes. The advantages of using the acousto-optic devices in a tandem scheme were discussed. The adjustment of such system due to on-axis shift is suitable for object selection. It was shown that the coherence function has optimal form for selecting a transparent object on light beam trace and optical delay line for semiconductor laser with short resonator can tune on maximum of coherent function at long distance. Accordingly the mutli-frequency laser can be used in heterodyne optical scheme instead of more costly stable one-frequency laser. A simple scheme of velocity measuring based on a semiconductive two-mode laser was proposed. Conclusions regarding the possibility using the resonator with acousto-optic device inside with a frequency chirp beam using for interferometer phase modulation measure system are arrived at. The application of a frequency-shifted laser beam to practical optical measuring system may improve the processing efficiency without additional adjustments.

Paper Details

Date Published: 30 May 2003
PDF: 6 pages
Proc. SPIE 5144, Optical Measurement Systems for Industrial Inspection III, (30 May 2003); doi: 10.1117/12.500282
Show Author Affiliations
Oksana P Budnyk, Institute of Applied Optics (Ukraine)
Ruslan A Lymarenko, Institute of Applied Optics (Ukraine)

Published in SPIE Proceedings Vol. 5144:
Optical Measurement Systems for Industrial Inspection III
Wolfgang Osten; Malgorzata Kujawinska; Katherine Creath, Editor(s)

© SPIE. Terms of Use
Back to Top