Share Email Print
cover

Proceedings Paper

Surface reflection coefficient correction technique for a microdisplacement OFS
Author(s): Cailin Wei
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Because of the variation of the reflection coefficient, the measuring accuracy is greatly affected with the reflected optical fiber displacement sensor (OFDS). In this presentation, the author presents a new kind of sensing scheme which can correct the reflection coefficient in real time and make it possible to realize on-line measurement.

Paper Details

Date Published: 1 August 1991
PDF: 5 pages
Proc. SPIE 1572, International Conference on Optical Fibre Sensors in China OFS(C) '91, (1 August 1991); doi: 10.1117/12.50003
Show Author Affiliations
Cailin Wei, Xi'an Institute of Optics and Fine Mechanics (China)


Published in SPIE Proceedings Vol. 1572:
International Conference on Optical Fibre Sensors in China OFS(C) '91

© SPIE. Terms of Use
Back to Top