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Proceedings Paper

Optimization of Lamb wave actuating and sensing materials for health monitoring of composite structures
Author(s): Seth S. Kessler; Christopher T. Dunn
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Paper Abstract

In a continuing effort to examine the effectiveness of Lamb wave methods for the health monitoring of composite structures, this paper presents the conclusions of an analytical and experimental study optimizing piezoelectric patches to detect damage within composite laminates. Previous research has demonstrated the ability of Lamb waves to provided useful information about the presence of damage in simple narrow coupons, and they have yielded the possibility of estimating severity and location of damage as well. During the course of this NRO funded research program, several types of piezoelectric materials in various configurations were analyzed in order to produce the highest force actuator and best resolution sensor at the lowest power level. Consideration was also placed towards directionality of wave propagation, and durability, reliability and reproducibility of the sensing patch itself. Experiments were then carried out on narrow coupon laminates to qualify and tune these actuating/sensing patches. New algorithms were used to filter and decompose the resulting signals to more efficiently detect the presence of damage for automated use, and gather information relating to the damage type, severity and location. SHM technologies will enable condition-based maintenance for efficient structural design, will reduced overall life-cycle costs, and eliminate scheduled inspections.

Paper Details

Date Published: 5 August 2003
PDF: 11 pages
Proc. SPIE 5056, Smart Structures and Materials 2003: Smart Structures and Integrated Systems, (5 August 2003); doi: 10.1117/12.499478
Show Author Affiliations
Seth S. Kessler, Metis Design Corp. (United States)
Christopher T. Dunn, Massachusetts Institute of Technology (United States)


Published in SPIE Proceedings Vol. 5056:
Smart Structures and Materials 2003: Smart Structures and Integrated Systems
Amr M. Baz, Editor(s)

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