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Proceedings Paper

Near-field imaging of out-of-plane light scattering in photonic crystal slabs
Author(s): Valentyn S. Volkov; Sergey I. Bozhevolnyi; Dirk Taillaert
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Paper Abstract

A collection scanning near-field optical microscope (SNOM) is used to image the propagating of light at telecommunication wavelengths (1520-1570 nm) along photonic crystal (PC) slabs, which combine slab waveguides with in-plane PCs consisting of one- and two-dimensional gratings. The efficient out-of-plane light scattering is directly observed for both 1D and 2D gratings (period 590 nm) fabricated on silicon-on-insulator wafers and the corresponding SNOM images are presented. Using the obtained SNOM images, we analyze light intensity distributions along PC gratings measured at different wavelengths and/or distances from the sample surface.

Paper Details

Date Published: 29 April 2003
PDF: 8 pages
Proc. SPIE 5118, Nanotechnology, (29 April 2003); doi: 10.1117/12.498756
Show Author Affiliations
Valentyn S. Volkov, Aalborg Univ. (Denmark)
Sergey I. Bozhevolnyi, Aalborg Univ. (Denmark)
Dirk Taillaert, Ghent Univ. (Belgium)


Published in SPIE Proceedings Vol. 5118:
Nanotechnology
Robert Vajtai; Xavier Aymerich; Laszlo B. Kish; Angel Rubio, Editor(s)

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