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Proceedings Paper

Second-harmonic far-field microscopy of random metal nanostructures
Author(s): Jonas Beermann; Sergey I. Bozhevolnyi; Victor Coello
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Paper Abstract

Using a scanning far-field second harmonic (SH) microscope we have excited surface plasmon polaritons (SPPs) on a 70 nm thick gold film surface covered with randomly distributed 80 nm wide gold particles. Multiple scattering of the SPPs by these gold particles leads to localization of the electromagnetic fields causing strongly enhanced and spatially localized SH generation. We investigate wavelength and polarization dependencies of both position and intensity of these SH bright spots for two different densities of random scatterers. Comparing SH and fundamental harmonic (FH) images, we conclude that the localized SH enhancement occurs due to overlap of FH and SH eigenmodes. Furthermore we confirm that for incident laser powers in the range 3-40mW, the bright spots exhibit quadratic intensity dependence. For the higher incident laser powers however, the strong heating of the surface seems to change the material properties causing some bright spots to disappear and others to emerge.

Paper Details

Date Published: 29 April 2003
PDF: 11 pages
Proc. SPIE 5118, Nanotechnology, (29 April 2003); doi: 10.1117/12.498747
Show Author Affiliations
Jonas Beermann, Aalborg Univ. (Denmark)
Sergey I. Bozhevolnyi, Aalborg Univ. (Denmark)
Victor Coello, Univ. Autonoma de Nuevo León (Mexico)


Published in SPIE Proceedings Vol. 5118:
Nanotechnology
Robert Vajtai; Xavier Aymerich; Laszlo B. Kish; Angel Rubio, Editor(s)

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