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Proceedings Paper

Mach-Zehnder interferometric system for measuring the refractive indices of uniaxial crystals
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Paper Abstract

We report a new interferometric technique for measuring the ordinary and extraordinary refractive indices of uniaxial crystals. The technique is based on the measurement of the rotation-dependent phase changes of the optical path length in crystal plates. Accurate measurement of the phase shift as a function of the rotation of the sample is achieved by using a fast-Fourier-transform based fringe analysis method for phase retrieval. The principle of the method is discussed and measurements of the ordinary and extraordinary refractive indices of a lithium niobate crystal are reported.

Paper Details

Date Published: 8 July 2003
PDF: 6 pages
Proc. SPIE 5036, Photonics, Devices, and Systems II, (8 July 2003); doi: 10.1117/12.498644
Show Author Affiliations
Sergio De Nicola, Istituto di Cibernetica del CNR (Italy)
Pietro Ferraro, Istituto di Cibernetica del CNR (Italy)
Istituto Nazionale di Ottica Applicata (Italy)
Andrea Finizio, Istituto di Cibernetica del CNR (Italy)
Paolo De Natale, Istituto Nazionale di Ottica Applicata (Italy)
Simonetta Grilli, Istituto Nazionale di Ottica Applicata (Italy)
Giovanni Pierattini, Istituto di Cibernetica del CNR (Italy)


Published in SPIE Proceedings Vol. 5036:
Photonics, Devices, and Systems II
Miroslav Hrabovsky; Dagmar Senderakova; Pavel Tomanek, Editor(s)

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