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Proceedings Paper

Flattening the EDFA gain profile
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Proc. SPIE 5144, Optical Measurement Systems for Industrial Inspection III, ; doi: 10.1117/12.498605
Show Author Affiliations
Anubhuti Shrivastava, Government Engineering College (India)
MANIT, Bhopal (India)


Published in SPIE Proceedings Vol. 5144:
Optical Measurement Systems for Industrial Inspection III
Wolfgang Osten; Malgorzata Kujawinska; Katherine Creath, Editor(s)

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