Share Email Print
cover

Proceedings Paper

Precise angle monitor based on the concept of pencil-beam interferometry
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The precise angle monitoring is a very important metrology task for research, development and industrials applications. Autocollimator is one of the most powerful and widely applied instruments for small angle monitoring, which is based on the principle of geometric optics. In this paper we introduce a new precise angle monitoring system, Pencil-beam Angle Monitor (PAM), base on pencil beam interferometry. It’s principle of operation is a combination of physical and geometrical optics. The angle calculation method is similar to the autocollimator. However, the autocollimator creates a cross image but the precise pencil- beam angle monitoring system produces an interference fringe on the focal plane. The advantages of the PAM are: high angular sensitivity, long-term stability character making angle monitoring over long time periods possible, high measurement accuracy in the order of sub-microradian, simultaneous measurement ability in two perpendicular directions or on two different objects, dynamic measurement possibility, insensitive to the vibration and air turbulence, automatic display, storage and analysis by use of the computer, small beam diameter making the alignment extremely easy and longer test distance. Some test examples are presented.

Paper Details

Date Published: 7 March 2006
PDF: 10 pages
Proc. SPIE 4101, Laser Interferometry X: Techniques and Analysis, (7 March 2006); doi: 10.1117/12.498388
Show Author Affiliations
Shinan Qian, Brookhaven National Lab. (United States)
Peter Z. Takacs, Brookhaven National Lab. (United States)


Published in SPIE Proceedings Vol. 4101:
Laser Interferometry X: Techniques and Analysis
Gordon M. Brown; Malgorzata Kujawinska; Werner P. O. Jueptner; Ryszard J. Pryputniewicz; Ryszard J. Pryputniewicz; Mitsuo Takeda, Editor(s)

© SPIE. Terms of Use
Back to Top