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Proceedings Paper

Interferometric method for deformation measurement of structures in industry
Author(s): Antonin Miks; Jiri Novak
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Paper Abstract

Interferometric measurement methods are based on the principle of interference of two coherent wave fields (object and reference) and consequent evaluation of the interference pattern. The measured quantity, e.g. deformation, is related to the optical path difference between both wave fields, which depends on the phase of the object wave field. The phase can be obtained from the values of the intensity of the interference field with phase measuring techniques. In the work there was proposed an optical method for measuring of static deformations based on the interference of coherent wave fields and phase shifting procedure. Detailed analysis of the measurement and evaluation process with respect to most important factors is performed.

Paper Details

Date Published: 8 July 2003
PDF: 5 pages
Proc. SPIE 5036, Photonics, Devices, and Systems II, (8 July 2003); doi: 10.1117/12.498236
Show Author Affiliations
Antonin Miks, Czech Technical Univ. in Prague (Czech Republic)
Jiri Novak, Czech Technical Univ. in Prague (Czech Republic)


Published in SPIE Proceedings Vol. 5036:
Photonics, Devices, and Systems II
Miroslav Hrabovsky; Dagmar Senderakova; Pavel Tomanek, Editor(s)

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