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Proceedings Paper

Performance comparison of reflective and emissive target projector systems for high-performance IR sensors
Author(s): Paul Tristan Bryant; Jack Grigor; Stephen W. McHugh; Steve White
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Paper Abstract

This paper presents qualitative and quantitative comparisons between emissive and reflective target technologies used in the application of IR target projection for thermal imager test and evaluation. Comparison of target projector performance in MRTD, SiTF, MTF, and other test areas will be presented. Relative advantages and disadvantages of emissive and reflective systems will be shown, in addition to requirements placed upon test laboratory environment by the different projector technologies. Discussion of software-based compensation techniques for mitigating reflected ambient effects, environmental ambient drift, and other anomalies will also be provided.

Paper Details

Date Published: 22 August 2003
PDF: 8 pages
Proc. SPIE 5076, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XIV, (22 August 2003); doi: 10.1117/12.498114
Show Author Affiliations
Paul Tristan Bryant, Santa Barbara Infrared, Inc. (United States)
Jack Grigor, Santa Barbara Infrared, Inc. (United States)
Stephen W. McHugh, Santa Barbara Infrared, Inc. (United States)
Steve White, Santa Barbara Infrared, Inc. (United States)


Published in SPIE Proceedings Vol. 5076:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XIV
Gerald C. Holst, Editor(s)

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