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Proceedings Paper

MIRAGE: developments in IRSP system development, RIIC design, emitter fabrication, and performance
Author(s): Paul Tristan Bryant; Jim Oleson; Brian Lindberg; Bruce Anderson; Kevin Sparkman; Stephen W. McHugh; John Lannon; David Vellenga; Scott Goodwin; Steve L. Solomon
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Paper Abstract

SBIR's family of MIRAGE infrared scene projection systems is undergoing significant growth and expansion. SBIR has completed the transition of Honeywell's resistive emitter technology to MCNC Research and Development Institute (MCNC-RDI), and is preparing for first-lot production of IR emitters in support of ongoing programs. Development of MIRAGE resistive emitter-based products is underway in order to increase maximum scene temperature, decrease radiance rise time, and improve overall operation. The 1024 x 1024 Large Format Resistive Array (LFRA) Read-In Integrated Circuit (RIIC) has been fabricated and tested, with emitter fabrication to start in mid-2003. A next-generation MIRAGE II(512 x 512) RIIC is also ready for fabrication, in support of high-performance MIRAGE II 512 x 512 systems providing greater than 750 K MWIR apparent temperature, and less than 5 ms 10-90% MWIR radiance rise time. In support of these new technologies and products, SBIR has developed test equipment and facilities for use in next-generation MIRAGE device wafer probing, test, evaluation, diagnostic, and assembly processes.

Paper Details

Date Published: 12 September 2003
PDF: 9 pages
Proc. SPIE 5092, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VIII, (12 September 2003); doi: 10.1117/12.498101
Show Author Affiliations
Paul Tristan Bryant, Santa Barbara Infrared, Inc. (United States)
Jim Oleson, Santa Barbara Infrared, Inc. (United States)
Brian Lindberg, Santa Barbara Infrared, Inc. (United States)
Bruce Anderson, Santa Barbara Infrared, Inc. (United States)
Kevin Sparkman, Santa Barbara Infrared, Inc. (United States)
Stephen W. McHugh, Santa Barbara Infrared, Inc. (United States)
John Lannon, MCNC Research and Development Institute (United States)
David Vellenga, MCNC Research and Development Institute (United States)
Scott Goodwin, MCNC Research and Development Institute (United States)
Steve L. Solomon, Acumen Consulting (United States)


Published in SPIE Proceedings Vol. 5092:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VIII
Robert Lee Murrer, Editor(s)

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