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Proceedings Paper

PEEM/LEEM resolution
Author(s): O. D. Potapkin; A. S. Belanov
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Paper Abstract

Universal expression for PEEM/LEEM resolution was found for a case when chromatical aberration and diffraction are limiting factors and for compound electrostatic and magnetic fields. This expression has the following advantage: it depends on emission energy and as a result resolution can be calculated for any electron start energy using psi function. It can be useful to find the best theoretical resolution.

Paper Details

Date Published: 1 April 2003
PDF: 3 pages
Proc. SPIE 5025, Fifth Seminar on Problems of Theoretical and Applied Electron and Ion Optics, (1 April 2003); doi: 10.1117/12.498007
Show Author Affiliations
O. D. Potapkin, Research Institute for Electron and Ion Optics (Russia)
A. S. Belanov, Moscow State Academy of Engineering and Informatics (Russia)


Published in SPIE Proceedings Vol. 5025:
Fifth Seminar on Problems of Theoretical and Applied Electron and Ion Optics
Anatoly M. Filachev, Editor(s)

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