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Proceedings Paper

Fluctuation microscopy: a technique for revealing atomic correlations in structurally noisy (disordered) materials
Author(s): Michael M. J. Treacy; J. Murray Gibson
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Paper Abstract

Flunctuation microscopy is a hybrid diffraction-imaging technique that yields information about higher-order correlations between structural units in materials. It has been shown to be well suited for detecting medium rangeorder in atomic positions in amorphous materials. This article presents a review of flunctuation microscopy as employed in a transmission electron microscope for the study of amorphous tetrahedral semiconductors. Possible extensions of the technique to other radiations such as x-rays, and for other structurally noisy materials such as polymers and starches, are discussed.

Paper Details

Date Published: 9 May 2003
PDF: 13 pages
Proc. SPIE 5112, Noise as a Tool for Studying Materials, (9 May 2003); doi: 10.1117/12.497805
Show Author Affiliations
J. Murray Gibson, Argonne National Las. (United States)


Published in SPIE Proceedings Vol. 5112:
Noise as a Tool for Studying Materials
Michael B. Weissman; Nathan E. Israeloff; A. Shulim Kogan, Editor(s)

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