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Proceedings Paper

Discussion on standard 1/f noise models in software packages: SPICE, HSPICE and BSIM3v3--comparison to MOSFET noise data on commercial c025
Author(s): Matteo Valenza; Alain Hoffmann; Frederic Martinez; A. Laigle; Joseph Rhayem; R. Gillon; Marnix Tack
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Paper Abstract

Three standard 1/f noise models for MOSFETs are actually implemented in software packages: SPICE, HSPICE and recently BSIM3v3l. The aim of this paper is to show the limitation of each of these implementations by comparison between noise simulations and noise measured data. We demonstrated that 1/f noise model implemented in SPICE and HSPICE can not predict correctly noise in all operating regimes which limit their usefulness for design purposes. We show that BSIM3v3 allows the better fitting with experimental noise results in all operating regimes.

Paper Details

Date Published: 12 May 2003
PDF: 9 pages
Proc. SPIE 5113, Noise in Devices and Circuits, (12 May 2003); doi: 10.1117/12.497578
Show Author Affiliations
Matteo Valenza, Univ. Montpellier II (France)
Alain Hoffmann, Univ. Montpellier II (France)
Frederic Martinez, Univ. Montpellier II (France)
A. Laigle, Univ. Montpellier II (France)
Joseph Rhayem, AMI Semiconductor Belgium BVBA (Belgium)
R. Gillon, AMI Semiconductor Belgium BVBA (Belgium)
Marnix Tack, AMI Semiconductor Belgium BVBA (Belgium)


Published in SPIE Proceedings Vol. 5113:
Noise in Devices and Circuits
M. Jamal Deen; Zeynep Celik-Butler; Michael E. Levinshtein, Editor(s)

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