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Proceedings Paper

Phase noise metrology and modeling of microwave transistor applications to the design of state-of-the-art dielectric resonator oscillators
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Paper Abstract

Phase noise in microwave transistors is studied both theoretically and experimentally using residual phase noise measurements. The experimental approach allows the exploration of many interesting features of phase noise generation in these devices, such as the dependence of phase noise versus microwave power or transistor low frequency loading, meanwhile nonlinear simulation is still necessary to optimise the microwave load and the whole oscillator circuit. The different behaviours described are illustrated in various microwave circuits, and particularly dielectric resonator oscillators, with some of them featuring state of the art performance.

Paper Details

Date Published: 12 May 2003
PDF: 13 pages
Proc. SPIE 5113, Noise in Devices and Circuits, (12 May 2003); doi: 10.1117/12.497467
Show Author Affiliations
Olivier Llopis, Lab. d'Analyse et d'Architecture des Systemes (France)
Gilles Cibiel, Lab. d'Analyse et d'Architecture des Systemes (France)


Published in SPIE Proceedings Vol. 5113:
Noise in Devices and Circuits
M. Jamal Deen; Zeynep Celik-Butler; Michael E. Levinshtein, Editor(s)

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