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Proceedings Paper

Optical diagnostics of InGaAs quantum well in pseudomorphic modulation-doped Al1-xGaxAs/InyGa1-yAs/GaAs heterostructures of less-than-critical layer thickness
Author(s): Georgiy G. Tarasov; S. R. Lavorik; Yu. I. Mazur; Mikhail Ya. Valakh; Z. Ya. Zhuchenko; H. Kissel; W. Ted Masselink; U. Mueller; C. Walther
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Paper Abstract

Pseudomorphic strained-layer AlxGa1-xAs/InyGa1-yAs/GaAs heterostructures have been studied by means of photoluminescence (PL) and Raman scattering. It is established the correlation between the PL line shape changes and the Raman spectra modification when the QW width is below the critical layer thickness (CLT) estimated to be of 25 nm for y = 0.1. The PL feature observed for the InGaAs QW width equal to 20 nm as extremely narrow exciton-like peak with the FWHM equal 1.5 meV at low temperature (T = 6K) transforms into broad band of the FWHM equal 16 meV when the QW width reaches the value about of 12 nm. The PL line shape broadening is accompanied by the modifications of Raman spectra. A new line arising at the spectral position v = 160 cm-1 is assigned to impurity-induced longitudinal acoustic optical mode of InyGa1-yAs. The changes observed in optical spectra are related to generation of defects in the under-CLT region.

Paper Details

Date Published: 1 April 2003
PDF: 8 pages
Proc. SPIE 5024, Selected Papers on Optics and Photonics: Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, (1 April 2003); doi: 10.1117/12.497184
Show Author Affiliations
Georgiy G. Tarasov, Institute of Semiconductor Physics (Ukraine)
S. R. Lavorik, Institute of Semiconductor Physics (Ukraine)
Yu. I. Mazur, Institute of Semiconductor Physics (Ukraine)
Mikhail Ya. Valakh, Institute of Semiconductor Physics (Ukraine)
Z. Ya. Zhuchenko, Institute of Semiconductor Physics (Ukraine)
H. Kissel, Humboldt-Univ. zu Berlin (Germany)
W. Ted Masselink, Humboldt-Univ. zu Berlin (Germany)
U. Mueller, Humboldt-Univ. zu Berlin (Germany)
C. Walther, Humboldt-Univ. zu Berlin (Germany)

Published in SPIE Proceedings Vol. 5024:
Selected Papers on Optics and Photonics: Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics
Sergey V. Svechnikov; Mikhail Ya. Valakh, Editor(s)

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