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Proceedings Paper

Nondestructive diagnostics of bulk GaAs and CdZnTe crystals by nanosecond and picosecond wave-mixing techniques
Author(s): M. Sudzius; V. Gudelis; A. Aleksiejunas; Jurgis Storasta; Kestutis Jarasiunas; Adriano Cola
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Paper Abstract

Laser induced transient gratings are used to study carrier generation and recombination properties via free carrier nonlinearity in differently grown GaAs and CdZnTe samples. Simulation of free carrier, photorefractive, and absorptive optical nonlinearities for 10-ns pulses and various illumination intensities allowed us to reveal conditions for the efficient transient quenching of EL2 defect at room temperature in semi-insulating GaAs. In addition, the straightforward coupling of nonlinear degenerate four wave-mixing signal at 1.06 μm with the steady-state charge states of EL2 defect is shown to allow a rough estimation of a crystal compensation ratio by EL2 defect. This novel method was applied to liquid-encapsulated Czochralski and Bridgeman-grown samples and compensation values ranging from 0.1 to approximately 0.6 have been derived. Also, feasibility of nanosecond- and picosecond-dynamic grating techniques for control of GaAs wafer quality is shown. The first one allowed fast and highly sensitive mapping of EL2 defect distribution and its charge state; the second one has proved a presence of a fast traps in the vicinity of dislocation conglomerations. Analogous mapping of CdZnTe wafers has shown very high spatial homogeneity of the samples, and revealed areas with the non-photoactive absorption or scattering of light.

Paper Details

Date Published: 1 April 2003
PDF: 12 pages
Proc. SPIE 5024, Selected Papers on Optics and Photonics: Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, (1 April 2003); doi: 10.1117/12.497179
Show Author Affiliations
M. Sudzius, Vilnius Univ. (Lithuania)
V. Gudelis, Vilnius Univ. (Lithuania)
A. Aleksiejunas, Vilnius Univ. (Lithuania)
Jurgis Storasta, Vilnius Univ. (Lithuania)
Kestutis Jarasiunas, Vilnius Univ. (Lithuania)
Adriano Cola, Istituto per lo Studio di nuovi Materiali per l'Elettronica (Italy)


Published in SPIE Proceedings Vol. 5024:
Selected Papers on Optics and Photonics: Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics
Sergey V. Svechnikov; Mikhail Ya. Valakh, Editor(s)

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