Share Email Print
cover

Proceedings Paper

Testing optical materials by birefringence dispersion mapping
Author(s): Andrzej L. Bajor
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

In many optical applications of crystals birefringence dispersion seems to play an equal role to birefringence spatial inhomogeneity itself. Mapping of parameters associated with birefringence dispersion on the entire areas of wafers cut out from crystalline boules seems then to be a powerful tool in testing and research works dealing with optical materials. The method of birefringence dispersion mapping and an automated, computer-controlled spectropolarimeter have been described. Its working has been illustrated by birefringence dispersion mapping in gamma irradiated LiNbO3 wafers.

Paper Details

Date Published: 1 April 2003
PDF: 12 pages
Proc. SPIE 5024, Selected Papers on Optics and Photonics: Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, (1 April 2003); doi: 10.1117/12.497176
Show Author Affiliations
Andrzej L. Bajor, Institute of Electronic Materials Technology (Poland)


Published in SPIE Proceedings Vol. 5024:
Selected Papers on Optics and Photonics: Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics
Sergey V. Svechnikov; Mikhail Ya. Valakh, Editor(s)

© SPIE. Terms of Use
Back to Top