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Proceedings Paper

Brief history of recombination noise in semiconductor junction devices
Author(s): Paul J Edwards
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Paper Abstract

This paper reviews the development of the theory and measurement of recombination noise in semiconductor junction devices. It traces this development from van der Ziel's corpuscular models of noise in junction diodes and transistors through to recent models of shot-noise suppression and non-classical light emission from laser and light-emitting diodes due to Yamamoto and co-workers.

Paper Details

Date Published: 12 May 2003
PDF: 13 pages
Proc. SPIE 5113, Noise in Devices and Circuits, (12 May 2003); doi: 10.1117/12.497117
Show Author Affiliations
Paul J Edwards, Univ. of Canberra (Australia)


Published in SPIE Proceedings Vol. 5113:
Noise in Devices and Circuits
M. Jamal Deen; Zeynep Celik-Butler; Michael E. Levinshtein, Editor(s)

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