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Proceedings Paper

1/f noise in amorphous silicon and silicon-germanium alloys
Author(s): Robert E. Johanson; Mehmet Gunes; Safa O. Kasap
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Paper Abstract

We report measurements of conductance noise of a-Si1-xGex:H in two different geometries; one where the current flow is transverse to the surface and the other longitudinal to it. Because of the large increase in sample resistance in going from transverse to longitudinal conduction, it was not possible to measure both geometries at the same temperature. However, the temperature trends are compatible with a common noise source. For both geometries, alloying with up to 40% Ge reduces the noise magnitude by a factor of 50 over that found in a-Si:H.

Paper Details

Date Published: 9 May 2003
PDF: 6 pages
Proc. SPIE 5112, Noise as a Tool for Studying Materials, (9 May 2003); doi: 10.1117/12.497096
Show Author Affiliations
Robert E. Johanson, Univ. of Saskatchewan (Canada)
Mehmet Gunes, Izmir Institute of Technology (Turkey)
Safa O. Kasap, Univ. of Saskatchewan (Canada)

Published in SPIE Proceedings Vol. 5112:
Noise as a Tool for Studying Materials
Michael B. Weissman; Nathan E. Israeloff; A. Shulim Kogan, Editor(s)

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