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Proceedings Paper

Fast and ultrasensitive nanomechanical displacement detection based on the single electron transistor
Author(s): Miles P. Blencowe
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Paper Abstract

We review recent experimental and theoretical work towards the realization of a fast and ultrasensitive, nanomechanical displacement detector based on the radio frequency single electron transistor (rf-SET).

Paper Details

Date Published: 8 May 2003
PDF: 10 pages
Proc. SPIE 5115, Noise and Information in Nanoelectronics, Sensors, and Standards, (8 May 2003); doi: 10.1117/12.496961
Show Author Affiliations
Miles P. Blencowe, Dartmouth College (United States)


Published in SPIE Proceedings Vol. 5115:
Noise and Information in Nanoelectronics, Sensors, and Standards
Laszlo B. Kish; Frederick Green; Giuseppe Iannaccone; John R. Vig, Editor(s)

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