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Proceedings Paper

New concept of measurement method for microlenses
Author(s): Koichi Nishizawa
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Proc. SPIE 4455, Micro- and Nano-optics for Optical Interconnection and Information Processing, ; doi: 10.1117/12.496713
Show Author Affiliations
Koichi Nishizawa, Polytechnic Univ. (Japan)


Published in SPIE Proceedings Vol. 4455:
Micro- and Nano-optics for Optical Interconnection and Information Processing
Mohammad R. Taghizadeh; Hugo Thienpont; Ghassan E. Jabbour, Editor(s)

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