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Proceedings Paper

Stitching interferometry: PSD analysis of measurement errors
Author(s): Michael Bray
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Proc. SPIE 4399, Optical Measurement Systems for Industrial Inspection II: Applications in Production Engineering, ; doi: 10.1117/12.496363
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Michael Bray, MB Optique (France)


Published in SPIE Proceedings Vol. 4399:
Optical Measurement Systems for Industrial Inspection II: Applications in Production Engineering

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