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Proceedings Paper

High-resolution synchrotron x-radiation diffraction imaging of crystals grown in microgravity and closely related terrestrial crystals
Author(s): Bruce W. Steiner; Ronald C. Dobbyn; David R. Black; Harold Burdette; Masao Kuriyama; Richard D. Spal; Lodewijk Van den Berg; Archibald L. Fripp; Richard T. Simchick; Ravindra B. Lal; Ashok K. Batra; David Matthiesen; Brian M. Ditchek
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Paper Abstract

Irregularities in three crystals grown in space and four terrestrial crystals have been compared by high resolution monochromatic synchrotron x-radiation diffraction imaging. For two of the materials, mercuric iodide and lead tin telluride, features consistent with the presence of additional phases in terrestrial samples have been suppressed in the comparable crystals grown in microgravity. Comparison of the images of highly purified terrestrial mercuric iodide with those of lower purity space and terrestrial material suggests specific detector performance models. These models ascribe the improved performance of detectors made from space-grown mercuric iodide to reduction in a widely dispersed impurity phase rather than to extreme macroscopic lattice regularity. While the general grain structure of lead tin telluride is not strongly affected by growth in microgravity, the subgrain uniformity of the space crystal is substantially higher than that of the comparable terrestrial crystal. The greater uniformity is associated with suppression of the second phase that appears to be characteristic of the terrestrial crystal examined.

Paper Details

Date Published: 1 December 1991
PDF: 12 pages
Proc. SPIE 1557, Crystal Growth in Space and Related Optical Diagnostics, (1 December 1991); doi: 10.1117/12.49594
Show Author Affiliations
Bruce W. Steiner, National Institute of Standards and Technology (United States)
Ronald C. Dobbyn, National Institute of Standards and Technology (United States)
David R. Black, National Institute of Standards and Technology (United States)
Harold Burdette, National Institute of Standards and Technology (United States)
Masao Kuriyama, National Institute of Standards and Technology (Japan)
Richard D. Spal, National Institute of Standards and Technology (United States)
Lodewijk Van den Berg, EG&G Energy Measurements (United States)
Archibald L. Fripp, NASA/Langley Research Ctr. (United States)
Richard T. Simchick, NASA/Langley Research Ctr. (United States)
Ravindra B. Lal, Alabama A&M Univ. (United States)
Ashok K. Batra, Alabama A&M Univ. (United States)
David Matthiesen, GTE Labs., Inc. (United States)
Brian M. Ditchek, GTE Labs., Inc. (United States)


Published in SPIE Proceedings Vol. 1557:
Crystal Growth in Space and Related Optical Diagnostics
James D. Trolinger; Ravindra B. Lal, Editor(s)

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