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Proceedings Paper

Some applications of a HOE-based desensitized interferometer in materials research
Author(s): Pierre Michel Boone; Pierre M. Jacquot
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Paper Details

Date Published: 1 December 1991
PDF: 10 pages
Proc. SPIE 1554A, Second Intl Conf on Photomechanics and Speckle Metrology: Speckle Techniques, Birefringence Methods, and Applications to Solid Mechanics, (1 December 1991); doi: 10.1117/12.49573
Show Author Affiliations
Pierre Michel Boone, Univ. of Gent (Belgium)
Pierre M. Jacquot, Swiss Federal Institute of Technology (Switzerland)


Published in SPIE Proceedings Vol. 1554A:
Second Intl Conf on Photomechanics and Speckle Metrology: Speckle Techniques, Birefringence Methods, and Applications to Solid Mechanics
Fu-Pen Chiang, Editor(s)

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