Share Email Print
cover

Proceedings Paper

Some applications of a HOE-based desensitized interferometer in materials research
Author(s): Pierre Michel Boone; Pierre M. Jacquot
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A holographic method suited for the measurement of flatness deviation is presented. This method takes advantage of the basic Fizeau arrangement usually meant for contouring analysis of relatively flat bodies. A desensitized interferometer is described allowing the measurement of rough objects, as frequently encountered in engineering practice. The key component of this interferometer is a diffractive optical element produced by recording two-wave interference patterns. Desensitization factors ranging from 1 to 100 with respect to a Fizeau interferometer can be achieved. Flatness checks of computer disks demonstrate the possibilities of the interferometer; deformation measurements performed with the desensitized interferometer on classical experimental mechanics specimens are presented: static testing on notched C-rings and on welds, and fatigue testing on notched three-point bend tests.

Paper Details

Date Published: 1 December 1991
PDF
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, (1 December 1991); doi: 10.1117/12.49573
Show Author Affiliations
Pierre Michel Boone, Univ. of Gent (Belgium)
Pierre M. Jacquot, Swiss Federal Institute of Technology (Switzerland)


Published in SPIE Proceedings Vol. 1554:
Second International Conference on Photomechanics and Speckle Metrology
Fu-Pen Chiang; Fu-Pen Chiang, Editor(s)

© SPIE. Terms of Use
Back to Top