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Proceedings Paper

Practical method for automatic detection of brightest ridge line of photomechanical fringe pattern
Author(s): Zu-Quan Ding; Xun-Hua Yuan
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Paper Abstract

It is a very important problem to process photomechanical fringe pattern quickly and automatically in the aspect of advanced photomechanics research. After analyzing the characteristics of photomechanical fringe pattern and comparing different methods for automatic detection of brightest ridge line of photomechanical fringe, we put forward a kind of synthetic and practical method, which includes image sub-processing, two-dimensional gray level fringe peak detection, binary image labelling by using different thresholds, dilating and thinning processing for gray level sub-peak line, removal of false line and connection of the fringe ridge line by using a cursor, copy of the fringe ridge line and its coordinate into printer. With the method, typical photomechanical fringe patterns have been processed on the HAMAMATSU DIPS C2000 and satisfactory results have been obtained.

Paper Details

Date Published: 1 December 1991
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Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, (1 December 1991); doi: 10.1117/12.49539
Show Author Affiliations
Zu-Quan Ding, Tongji Univ. (China)
Xun-Hua Yuan, Tongji Univ. (Sweden)


Published in SPIE Proceedings Vol. 1554:
Second International Conference on Photomechanics and Speckle Metrology
Fu-Pen Chiang; Fu-Pen Chiang, Editor(s)

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