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Proceedings Paper

Statistical interferometry based on the statistics of speckle phase
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Paper Abstract

A new technique of optical interferometry based on the statistics of the fully developed speckle field is proposed. It is revealed that the complete randomness of the speckle phase can play a role of a standard phase in a statistical sense, and the phase of the object under testing can be derived in a statistical way, in contrast to conventional interferometry. The technique is first described in relation to the phase-shifting interferometry and the compensation problem for the phase-shift error. Next the method is generalized as an independent interferometric technique.

Paper Details

Date Published: 1 December 1991
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Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, (1 December 1991); doi: 10.1117/12.49518
Show Author Affiliations
Hirofumi Kadono, Saitama Univ. (Japan)
Satoru Toyooka, Saitama Univ. (Japan)


Published in SPIE Proceedings Vol. 1554:
Second International Conference on Photomechanics and Speckle Metrology
Fu-Pen Chiang; Fu-Pen Chiang, Editor(s)

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