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Proceedings Paper

Surface contouring using electronic speckle pattern interferometry
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Paper Abstract

Electronic Speckle Pattern Interferometry is used extensively throughout the Engineering sector as an analytical tool. The full potential of the instrument may be realized by the ability to record and shape data without alterations to the optical present here a method of shape measurement which may be optical apparatus identical to conventional out-of-plane instruments. The shape measurement is achieved by small shifts of optical fibres carrying the object and reference beams. We show that the fringe patterns produced are identical to projected fringe contours, and may be analysed in the usual way.

Paper Details

Date Published: 1 December 1991
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, (1 December 1991); doi: 10.1117/12.49512
Show Author Affiliations
David Kerr, Loughborough Univ. of Technology (United Kingdom)
Ramon Rodriguez-Vera, Loughborough Univ. of Technology (Mexico)
Fernando Mendoza Santoyo, Loughborough Univ. of Technology (Mexico)

Published in SPIE Proceedings Vol. 1554:
Second International Conference on Photomechanics and Speckle Metrology
Fu-Pen Chiang; Fu-Pen Chiang, Editor(s)

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