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Proceedings Paper

Contouring by DSPI for surface inspection
Author(s): Domenica Paoletti; Giuseppe Schirripa Spagnolo
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Paper Abstract

A contouring technique based on digital speckle pattern interferometry is developed for investigation of surface defects in deterioration studies. A specific software is proposed for an automatic quantitative evaluation of defect dimensions. Some experimental tests effected on laboratory samples have demonstrated the suitability of the method.

Paper Details

Date Published: 1 December 1991
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, (1 December 1991); doi: 10.1117/12.49511
Show Author Affiliations
Domenica Paoletti, Univ. di L'Aquila (Italy)
Giuseppe Schirripa Spagnolo, Univ. di L'Aquila (Italy)

Published in SPIE Proceedings Vol. 1554:
Second International Conference on Photomechanics and Speckle Metrology
Fu-Pen Chiang; Fu-Pen Chiang, Editor(s)

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