Proceedings Paper
Speckle measurement for 3-D surface movement| Format | Member Price | Non-Member Price |
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Paper Abstract
For measuring 3D surface movement by means of Electronic-Speckle-Pattern-Interferometry the decorrelation of the out-of-plane component due to the additional inplane movement must be minimized by a resampling of the speckle images or the calculated phase maps in dependence of the measured inplane movement.
Paper Details
Date Published: 1 December 1991
PDF
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, (1 December 1991); doi: 10.1117/12.49498
Published in SPIE Proceedings Vol. 1554:
Second International Conference on Photomechanics and Speckle Metrology
Fu-Pen Chiang; Fu-Pen Chiang, Editor(s)
Proc. SPIE 1554, Second International Conference on Photomechanics and Speckle Metrology, (1 December 1991); doi: 10.1117/12.49498
Show Author Affiliations
Jens Hilbig, Technical Univ. Braunschweig (Germany)
Reinhold Ritter, Technical Univ. Braunschweig (Germany)
Published in SPIE Proceedings Vol. 1554:
Second International Conference on Photomechanics and Speckle Metrology
Fu-Pen Chiang; Fu-Pen Chiang, Editor(s)
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