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Proceedings Paper

Study of TEM micrographs of thin-film cross-section replica using spectral analysis
Author(s): Ting Mei; Xu Liu; Jinfa Tang; Peifu Gu
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Paper Details

Date Published: 1 December 1991
PDF: 9 pages
Proc. SPIE 1554A, Second Intl Conf on Photomechanics and Speckle Metrology: Speckle Techniques, Birefringence Methods, and Applications to Solid Mechanics, (1 December 1991); doi: 10.1117/12.49494
Show Author Affiliations
Ting Mei, Zhejiang Univ. (China)
Xu Liu, Zhejiang Univ. (China)
Jinfa Tang, Zhejiang Univ. (China)
Peifu Gu, Zhejiang Univ. (China)


Published in SPIE Proceedings Vol. 1554A:
Second Intl Conf on Photomechanics and Speckle Metrology: Speckle Techniques, Birefringence Methods, and Applications to Solid Mechanics
Fu-Pen Chiang, Editor(s)

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