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Proceedings Paper

Measurement of residual stresses in plastic materials by electronic shearography
Author(s): Kahwah Long; Y.Y. Hung; Joseph Der Hovanesian
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Paper Details

Date Published: 1 December 1991
PDF: 8 pages
Proc. SPIE 1554A, Second Intl Conf on Photomechanics and Speckle Metrology: Speckle Techniques, Birefringence Methods, and Applications to Solid Mechanics, (1 December 1991); doi: 10.1117/12.49485
Show Author Affiliations
Kahwah Long, Oakland Univ. (United States)
Y.Y. Hung, Oakland Univ. (United States)
Joseph Der Hovanesian, Oakland Univ. (United States)


Published in SPIE Proceedings Vol. 1554A:
Second Intl Conf on Photomechanics and Speckle Metrology: Speckle Techniques, Birefringence Methods, and Applications to Solid Mechanics
Fu-Pen Chiang, Editor(s)

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