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Proceedings Paper

Combined x-ray absorption spectroscopy and x-ray powder diffraction
Author(s): Andrew J. Dent; Gareth E. Derbyshire; G. Neville Greaves; Christine A. Ramsdale; J. W. Couves; Richard Jones; C. Richard A. Catlow; John M. Thomas
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Paper Abstract

The complementary nature of x-ray absorption fine structure (XAFS) spectroscopy and x-ray diffraction (XRD) is described. In particular XAFS records the local structure while XRD detects the long-range crystallinity enabling the heterogeneity of materials like single-phase catalysts to be explored. Both measurements can be combined to facilitate novel in situ experiments. We have used a horizontal energy dispersed x-ray beam and a photodiode array to detect transmission XAFS and a curved position sensitive detector positioned in the vertical plane to record XRD. This arrangement has been used to follow the formation of mixed-oxide catalysts.

Paper Details

Date Published: 1 November 1991
PDF: 11 pages
Proc. SPIE 1550, X Rays in Materials Analysis II: Novel Applications and Recent Developments, (1 November 1991); doi: 10.1117/12.49471
Show Author Affiliations
Andrew J. Dent, SERC Daresbury Lab. (United Kingdom)
Gareth E. Derbyshire, SERC Daresbury Lab. (United Kingdom)
G. Neville Greaves, SERC Daresbury Lab. (United Kingdom)
Christine A. Ramsdale, SERC Daresbury Lab. (United Kingdom)
J. W. Couves, Royal Institution of Great Britain (United Kingdom)
Richard Jones, Royal Institution of Great Britain (United Kingdom)
C. Richard A. Catlow, Royal Institution of Great Britain (United Kingdom)
John M. Thomas, Royal Institution of Great Britain (United Kingdom)


Published in SPIE Proceedings Vol. 1550:
X Rays in Materials Analysis II: Novel Applications and Recent Developments
Dennis M. Mills, Editor(s)

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