Share Email Print
cover

Proceedings Paper

On-line yield monitoring of potatoes during harvest with image processing
Author(s): Jan W. Hofstee; Daan Goense
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Details

Date Published:
PDF
Proc. SPIE 4203, Biological Quality and Precision Agriculture II, ; doi: 10.1117/12.494661
Show Author Affiliations
Jan W. Hofstee, Wageningen Univ. (Netherlands)
Daan Goense, Wageningen Univ. (Netherlands)


Published in SPIE Proceedings Vol. 4203:
Biological Quality and Precision Agriculture II
James A. DeShazer; George E. Meyer, Editor(s)

© SPIE. Terms of Use
Back to Top