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Proceedings Paper

Model-based flaw reconstruction using limited-view x-ray projections and flawless prototype image
Author(s): Hsien-Sen Hung; Mete Eray
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Paper Abstract

A new flaw reconstruction scheme is proposed for locating and sizing flaws embedded in materials as well as estimating their absorption coefficients in an unified manner. Based on x- ray projections and flawless prototype tomogram, the proposed method locates flaws by detecting their convex hulls, fits elliptic models into the convex hulls with identical moments of inertia, and estimates flaws' absorption coefficients using least-squares principle. Due to the capability of annihilating false-alarm flaws, the proposed method improves the detection performance of the convex hull method. For convex type of flaws, simulation results show that the proposed method can produce very accurate estimates of flaw intensity as well as flaw size and orientation for full-view and limited-view noiseless cases.

Paper Details

Date Published: 1 November 1991
PDF: 12 pages
Proc. SPIE 1550, X Rays in Materials Analysis II: Novel Applications and Recent Developments, (1 November 1991); doi: 10.1117/12.49465
Show Author Affiliations
Hsien-Sen Hung, Iowa State Univ. (Taiwan)
Mete Eray, Iowa State Univ. (United States)


Published in SPIE Proceedings Vol. 1550:
X Rays in Materials Analysis II: Novel Applications and Recent Developments
Dennis M. Mills, Editor(s)

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