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Proceedings Paper

Applications of powder diffraction in materials science using synchrotron radiation
Author(s): Michael Hart
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Paper Abstract

The brightness of third-generation synchrotron radiation sources is so high that the x-ray optics of diffractometers can be aberration-free and their instrument functions can be perfectly symmetric. At the same time there is sufficient intensity that no further compromises are required and experiments are brief. Adequate stability and resolution can be obtained only if care is taken to eliminate the effects of primary beam heating on the x-ray optics. At present state of the art, the quality of data need depend only on the quality of the sample be it a powder, a polycrystal, or a thin film. Achievements include lattice parameter determination in the parts-per-million range, high intensity, and high resolution for structural studies, anomalous dispersion for structure refinement and phase identification, and high resolution angle and energy scanning in the same instrument. Most recently we have demonstrated aberration-free powder patterns at SSRL and perfect monochromators for one-third kW x-ray beams at NSLS.

Paper Details

Date Published: 1 November 1991
PDF: 7 pages
Proc. SPIE 1550, X Rays in Materials Analysis II: Novel Applications and Recent Developments, (1 November 1991); doi: 10.1117/12.49462
Show Author Affiliations
Michael Hart, Univ. of Manchester (United Kingdom)

Published in SPIE Proceedings Vol. 1550:
X Rays in Materials Analysis II: Novel Applications and Recent Developments
Dennis M. Mills, Editor(s)

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