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Proceedings Paper

Advances in three-level high fill-factor microbolometer IRFPA
Author(s): Sang-Baek Ju; Yoon-Joong Yong; Sang-Gook Kim
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Proc. SPIE 4130, Infrared Technology and Applications XXVI, ; doi: 10.1117/12.494319
Show Author Affiliations
Sang-Baek Ju, Daewoo Electronics Co., Ltd. (South Korea)
Yoon-Joong Yong, Daewoo Electronics Co., Ltd. (South Korea)
Sang-Gook Kim, Daewoo Electronics Co., Ltd. (United States)


Published in SPIE Proceedings Vol. 4130:
Infrared Technology and Applications XXVI
Bjorn F. Andresen; Gabor F. Fulop; Marija Strojnik, Editor(s)

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