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Proceedings Paper

High-density wavefront control using segmented micromirrors and microlenses
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Proc. SPIE 4124, High-Resolution Wavefront Control: Methods, Devices, and Applications II, ; doi: 10.1117/12.494091
Show Author Affiliations
John R. Karpinsky, SY Technology, Inc. (United States)
Jay A. Hammer, SY Technology, Inc. (United States)
Michael Whitley, SY Technology, Inc. (United States)


Published in SPIE Proceedings Vol. 4124:
High-Resolution Wavefront Control: Methods, Devices, and Applications II
John D. Gonglewski; Mikhail A. Vorontsov; Mark T. Gruneisen, Editor(s)

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