Share Email Print
cover

Proceedings Paper

Raman scattering and mapping on silicon carbide wafers
Author(s): Jingli Chen; Zhe Chuan Feng; Jianyi Lin; Soo-Jin Chua; Geraint A. Evans; Ken P. J. Williams; G. D. Pitt
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Details

Date Published:
PDF
Proc. SPIE 4098, Optical Devices and Diagnostics in Materials Science, ; doi: 10.1117/12.494086
Show Author Affiliations
Jingli Chen, National Univ. of Singapore (Singapore)
Zhe Chuan Feng, Institute of Materials Research and Engineering (Singapore)
Jianyi Lin, National Univ. of Singapore (Singapore)
Soo-Jin Chua, Institute of Materials Research and Engineering (Singapore)
Geraint A. Evans, Univ. of Bristol (United Kingdom)
Ken P. J. Williams, Renishaw Transducer Systems Ltd. (United Kingdom)
G. D. Pitt, Renishaw Transducer Systems Ltd. (United Kingdom)


Published in SPIE Proceedings Vol. 4098:
Optical Devices and Diagnostics in Materials Science
David L. Andrews; Toshimitsu Asakura; Suganda Jutamulia; Wiley P. Kirk; Max G. Lagally; Ravindra B. Lal; James D. Trolinger; David L. Andrews, Editor(s)

© SPIE. Terms of Use
Back to Top