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Proceedings Paper

X-ray multilayer-coated reflection gratings: theory and applications
Author(s): Michel Neviere; Antonius J. F. den Boggende
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Paper Abstract

Among the various rigorous electromagnetic methods previously developed in order to compute and optimize grating efficiencies, Differential Formalism turns out to be the only one capable of dealing with reflection gratings in the x ray region. Not only can the method tackle bare gratings, but it is generalized in order to handle a multilayer stack deposited on top of a blazed grating. This can be a classical stack of equal pairs of dielectric and absorber, but the method can also deal with an arbitrary number of layers with arbitrary thicknesses varying from bottom to top. Contrary to the classical stacks which give high efficiencies in a narrow range of incidence or wavelength, the second type of stacks can be optimized in order to obtain a broadband efficiency curve. It is shown that with the grazing incidence angles used in the x ray domain the reflection of the multilayer structure cannot be considered to be decoupled from the diffraction of the groove profile. Consequently, a full electromagnetic study has to be carried out for the entire device in order to get reliable results.

Paper Details

Date Published: 1 October 1991
PDF: 9 pages
Proc. SPIE 1545, International Conference on the Application and Theory of Periodic Structures, (1 October 1991); doi: 10.1117/12.49407
Show Author Affiliations
Michel Neviere, Lab. d'Optique Electromagnetique (France)
Antonius J. F. den Boggende, Lab. for Space Research Utrecht (Netherlands)

Published in SPIE Proceedings Vol. 1545:
International Conference on the Application and Theory of Periodic Structures
Jeremy M. Lerner; Wayne R. McKinney, Editor(s)

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