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Computation of minimum resolvable temperature using automated measurements of MTF, 3D noise, and aliasing
Author(s): James A. Dawson; Philip R. Owen; Mark A. Chambliss; Jeff W. Todd
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Proc. SPIE 4030, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XI, ; doi: 10.1117/12.493357
Show Author Affiliations
James A. Dawson, Dynetics, Inc. (United States)
Philip R. Owen, U.S. Army Aviation and Missile Command (United States)
Mark A. Chambliss, Dynetics, Inc. (United States)
Jeff W. Todd, Dynetics, Inc. (United States)


Published in SPIE Proceedings Vol. 4030:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XI
Gerald C. Holst, Editor(s)

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