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Proceedings Paper

Characterization of multilayers on electroformed substrates
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Proc. SPIE 4496, X-Ray Optics for Astronomy: Telescopes, Multilayers, Spectrometers, and Missions, ; doi: 10.1117/12.492473
Show Author Affiliations
Suzanne E. Romaine, Harvard-Smithsonian Ctr. for Astrophysics (United States)
Adrian Ivan, Harvard-Smithsonian Ctr. for Astrophysics (United States)
Ricardo J. Bruni, Harvard-Smithsonian Ctr. for Astrophysics (United States)
Paul Gorenstein, Harvard-Smithsonian Ctr. for Astrophysics (United States)
Oberto Citterio, Osservatorio Astronomico di Brera (Italy)
Giovanni Pareschi, Osservatorio Astronomico di Brera (Italy)
Mauro Ghigo, Osservatorio Astronomico di Brera (Italy)
Brian D. Ramsey, NASA Marshall Space Flight Ctr. (United States)


Published in SPIE Proceedings Vol. 4496:
X-Ray Optics for Astronomy: Telescopes, Multilayers, Spectrometers, and Missions
Paul Gorenstein; Richard B. Hoover, Editor(s)

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