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Proceedings Paper

Radiographic x-ray inspection for defects of ball grid array
Author(s): Jong Hyeong Kim; Kuk Won Ko; Kee Soo Jin
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Proc. SPIE 4564, Optomechatronic Systems II, ; doi: 10.1117/12.491904
Show Author Affiliations
Jong Hyeong Kim, Samsung Electronics Co., Ltd. (South Korea)
Kuk Won Ko, Mirae Corp. (South Korea)
Kee Soo Jin, Mirae Corp. (South Korea)


Published in SPIE Proceedings Vol. 4564:
Optomechatronic Systems II
Hyungsuck Cho, Editor(s)

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