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Proceedings Paper

Characterization of deep level defects in nGaN
Author(s): Chew Beng Soh; Soo-Jin Chua; Dong Zhi Chi; Hui Fern Lim
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Proc. SPIE 4598, Photonics Technology in the 21st Century, ; doi: 10.1117/12.491506
Show Author Affiliations
Chew Beng Soh, National Univ. of Singapore (Singapore)
Soo-Jin Chua, Institute of Materials Research and Engineering and National Univ. of Singapore (Singapore)
Dong Zhi Chi, Institute of Materials Research and Engineering (Singapore)
Hui Fern Lim, National Univ. of Singapore (Singapore)


Published in SPIE Proceedings Vol. 4598:
Photonics Technology in the 21st Century

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