Share Email Print

Proceedings Paper

Fiber optic infrared measurement system for thermal measurement of a Kapton HN sample
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A dual-waveband, fiber-optic/infrared (F-O/IR) temperature measurement system was enhanced with incorporated optical chopping and applied to measure the surface temperature of a coated (aluminized) Kapton HN sample. The F-O/IR system provides a non-contact means for accurate membrane temperature measurement without distorting surface contour. An FTIR spectrometer was used to measure the absorptance and reflectance properties of the Kapton HN sample. A long-wave IR scanner was used to validate and enhance results obtained from the spectrometer and predict temperature dependence of optical properties. Data are presented that demonstrate the feasibility to apply the F-O/IR system for non-contact temperature measurement of highly reflective surfaces at low temperatures.

Paper Details

Date Published: 1 April 2003
PDF: 8 pages
Proc. SPIE 5073, Thermosense XXV, (1 April 2003); doi: 10.1117/12.490003
Show Author Affiliations
Matthew J. Rowley, James Madison Univ. (United States)
Danielle N. Rockwood, Univ. of Delaware (United States)
Jonathan J. Miles, James Madison Univ. (United States)

Published in SPIE Proceedings Vol. 5073:
Thermosense XXV
K. Elliott Cramer; Xavier P. Maldague, Editor(s)

© SPIE. Terms of Use
Back to Top