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Proceedings Paper

Absorbed-dose distribution of the secondary electrons near an x-ray microbeam
Author(s): Vladimir N. Vasiliev
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Paper Abstract

Dose distributions of the secondary electrons were calcualted by Monte Carlo code EGS4 in water nera an infinitesimal area photon microbeam. The photon eneryg was from 10 to 100 keV, the radial resolution was 2 μm and the statistical error was from 0.1 to 1-2 percent depending on the calculation point. The Compton recoil electron and photoelectron dose fractions were separated from the dose profiles and fitted by simple analytical functions.

Paper Details

Date Published: 30 July 2002
PDF: 6 pages
Proc. SPIE 4765, International Conference on X-ray and Neutron Capillary Optics, (30 July 2002); doi: 10.1117/12.489752
Show Author Affiliations
Vladimir N. Vasiliev, Russian Scientific Ctr. of Roentgenology and Radiology (Russia)


Published in SPIE Proceedings Vol. 4765:
International Conference on X-ray and Neutron Capillary Optics
Muradin A. Kumakhov, Editor(s)

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